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Introduction, characteristics, and applications of Texas Instruments LMK04714-Q1 dual-ring clock jitter cleaner

2/16/2024 9:40:00 AM

Summary: High-performance clock regulator with JEDEC JESD204B/C support for space applications.

LMK04714-Q1 Texas Instruments

The Texas Instruments LMK04714-Q1 Dual Ring Clock Jitter Cleaner is a high performance clock conditioner supporting JEDEC JESD204B/C space applications. Each of the PLL2's 14 clock outputs can be configured to drive seven JESD204B/C converters. The Texas Instruments LMK04714-Q1 can also drive other logic devices using this device and the SYSREF clock. SYSREF can be supplied using DC and AC coupling. Because the device is not limited to JESD204B/C applications, the 14 outputs can be individually configured as high-performance outputs for traditional clocking systems.


characteristic

  • AEC-Q100 Grade 1 (-40°C to 125°C)

  • 3255MHz maximum clock output frequency

  • Multi-mode: dual phase locked loop, single phase locked loop, clock distribution

  • 6GHz external VCO or distribution input

  • Ultra low noise, 2500MHz

    • 54fs RMS jitter (12kHz to 20MHz)

    • 64fs RMS jitter (100Hz to 20MHz)

    • -157.6dBc/Hz noise floor

  • 3200MHz ultra-low noise

    • 61fs RMS jitter (12kHz to 20MHz)

    • 67fs RMS jitter (100Hz to 100MHz)

    • -156.5dBc/Hz noise floor

  • PLL2

    • The phase locked loop frequency is -230dBc/Hz

    • Phase locked loop 1/f is -128dBc/Hz

    • Phase detection rate up to 320MHz

    • Two integrated vcos: 2440MHz ~ 2600MHz and 2945MHz ~ 3255MHz

  • Up to 14 differential device clocks

    • CML, LVPECL, LCPECL, HSDS, LVDS and 2xLVCMOS programmable outputs

  • Up to 1 buffered VCXO/XO output

    • LVPECL, LVDS, 2xLVCMOS programmable

  • 1-1023 CLKOUT integer division

  • 1-8191 SYSREF integer division

  • 25ps step analog delay SYSREF clock

  • Digital delays and dynamic digital delays for device clock and SYSREF

  • Hold mode with PLL1

  • 0 delay with PLL1 or PLL2

  • High reliability

    • control baseline

    • an assembly/test site

    • 1 manufacturing location

    • Extend product life cycle

    • Extended product change notifications

    • Product traceability


app

  • car radar

  • Data converter clock

  • lidar


Functional block diagram


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